Título: The Effect of Measurement Error on Binary RRT Models
Ciclo de Palestras do PPGE - 2025
Palestrante: Sat Gupta
Data: 08/04/25
Duração: 09:00 - 10:30
Local: I-044-B
Laboratório de Sistemas Estocásticos (LSE)
Centro de Tecnologia (CT) - UFRJ
Resume: This study introduces the effect of measurement error on Binary Randomized Response Technique (RRT) models. We discuss a method for estimating and accounting for measurement error in two basic RRT models (Warner and Greenberg models) and one more comprehensive RRT model (Lovig et al. mixture model). Both theoretical and empirical results show that not accounting for measurement errors leads to inaccurate estimates. We introduce estimators that account for the effect of measurement errors. Furthermore, we introduce a new measure of model privacy using an odds ratio statistic which offers better interpretability than traditional methods.
